Browsing by Author Z. Tarnawski

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  • Hydrogen-storage-characteristics-of-Ti-and-V-based-thin-films_2016_Journal-of-Science-Advanced-Materials-and-Devices.pdf.jpg
  • Article


  • Authors: Z. Tarnawski; N.-T.H. Kim-Ngan (2016)

  • Series of thin films of single-, bi- and tri-layered structure consisting of Ti, V, TiO2 and V2O5 layer and/or mixed Ti- V- Ni layer with different layer sequences and thicknesses were prepared by the sputtering technique on Si and SiO2 substrates. The layer chemical composition and thickness were determined by a combined analysis of X-ray diffraction, X-ray reflectometry, Rutherford backscattering and optical reflectivity spectra. Thefilms were hydrogenated at 1 bar at 300 C and/or at high pressures up to 100 bar at room temperature. The hydrogen concentration and hydrogen profile was determined by means of a secondary ion mass spectroscopy and N-15 Nuclear Reaction Analysis. The ...

Browsing by Author Z. Tarnawski

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 1 of 1
  • Hydrogen-storage-characteristics-of-Ti-and-V-based-thin-films_2016_Journal-of-Science-Advanced-Materials-and-Devices.pdf.jpg
  • Article


  • Authors: Z. Tarnawski; N.-T.H. Kim-Ngan (2016)

  • Series of thin films of single-, bi- and tri-layered structure consisting of Ti, V, TiO2 and V2O5 layer and/or mixed Ti- V- Ni layer with different layer sequences and thicknesses were prepared by the sputtering technique on Si and SiO2 substrates. The layer chemical composition and thickness were determined by a combined analysis of X-ray diffraction, X-ray reflectometry, Rutherford backscattering and optical reflectivity spectra. Thefilms were hydrogenated at 1 bar at 300 C and/or at high pressures up to 100 bar at room temperature. The hydrogen concentration and hydrogen profile was determined by means of a secondary ion mass spectroscopy and N-15 Nuclear Reaction Analysis. The ...