Full metadata record
DC FieldValueLanguage
dc.contributor.authorD.R. Sahu-
dc.contributor.authorTzu-Jung Wu-
dc.contributor.authorSheng-Chang Wang-
dc.contributor.authorJow-Lay Huang-
dc.date.accessioned2017-08-23T08:25:14Z-
dc.date.available2017-08-23T08:25:14Z-
dc.date.issued2017-
dc.identifier.issn2468-2284-
dc.identifier.urihttp://repository.vnu.edu.vn/handle/VNU_123/57970-
dc.descriptionp. 225-232en_US
dc.description.abstractThe NiO thinfilms were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UVeVIS spectroscopy and cyclic voltammetry. The thickerfilms were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinnerfilms of 170 nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1 C/cm2 than the thicker ones. However, the thickerfilms showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinnerfilms became deteriorated after 800 cycling tests.en_US
dc.language.isootheren_US
dc.publisherH. : ĐHQGHNen_US
dc.subjectE-beam evaporationen_US
dc.subjectNickel oxideen_US
dc.subjectElectrochromic propertiesen_US
dc.titleElectrochromic behavior of NiO film prepared by e-beam evaporationen_US
dc.typeArticleen_US
Appears in Collections:Advanced Materials and Devices


  • Electrochromic-behavior-of-NiO-film-prepared-by-e-beam-ev...
    • Size : 1,96 MB

    • Format : Adobe PDF

    • View : 
    • Download : 
  • Full metadata record
    DC FieldValueLanguage
    dc.contributor.authorD.R. Sahu-
    dc.contributor.authorTzu-Jung Wu-
    dc.contributor.authorSheng-Chang Wang-
    dc.contributor.authorJow-Lay Huang-
    dc.date.accessioned2017-08-23T08:25:14Z-
    dc.date.available2017-08-23T08:25:14Z-
    dc.date.issued2017-
    dc.identifier.issn2468-2284-
    dc.identifier.urihttp://repository.vnu.edu.vn/handle/VNU_123/57970-
    dc.descriptionp. 225-232en_US
    dc.description.abstractThe NiO thinfilms were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UVeVIS spectroscopy and cyclic voltammetry. The thickerfilms were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinnerfilms of 170 nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1 C/cm2 than the thicker ones. However, the thickerfilms showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinnerfilms became deteriorated after 800 cycling tests.en_US
    dc.language.isootheren_US
    dc.publisherH. : ĐHQGHNen_US
    dc.subjectE-beam evaporationen_US
    dc.subjectNickel oxideen_US
    dc.subjectElectrochromic propertiesen_US
    dc.titleElectrochromic behavior of NiO film prepared by e-beam evaporationen_US
    dc.typeArticleen_US
    Appears in Collections:Advanced Materials and Devices


  • Electrochromic-behavior-of-NiO-film-prepared-by-e-beam-ev...
    • Size : 1,96 MB

    • Format : Adobe PDF

    • View : 
    • Download :