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dc.contributor.authorLe, Thi Giang-
dc.contributor.authorNguyen, Manh An-
dc.date.accessioned2017-08-09T07:35:42Z-
dc.date.available2017-08-09T07:35:42Z-
dc.date.issued2014-
dc.identifier.citationLe, T. G. & Nguyen, M. A. (2014). Segregation of Manganese Atoms during the Growth of Ge1-xMnx Nanocolumns on Ge (001). VNU Journal of Science: Mathematics – Physics, 30(2), 10-17.-
dc.identifier.issn2588-1124-
dc.identifier.urihttp://repository.vnu.edu.vn/handle/VNU_123/56059-
dc.description.abstractHigh resolution - transmission electron microscopy (HR-TEM), along with Reflection High-Energy Electron Diffraction (RHEED) and Laser pulse atom probe tomography (LP- APT) were used to investigate the growth kinetics of Ge1-xMnx nanocolumn on Ge(001) and the mechanism of Ge1-xMnx nanocolumn formation. The results evidence that during the deposition of Ge1-xMnx film, Mn atoms diffuse into the Ge matrix to form Mn-rich regions and the upward segregation of Mn atoms along the [001] direction is the origin of the Mn concentration enrichment inside the nanocolumns.en_US
dc.language.isoenen_US
dc.publisherH. : ĐHQGHNen_US
dc.relation.ispartofseriesVNU Journal of Science: Mathematics – Physics-
dc.subjectDiluted magnetic semiconductorsen_US
dc.subjectnanocolumnsen_US
dc.subjectGe3Mn5 clustersen_US
dc.subjectMn segregationen_US
dc.titleSegregation of Manganese Atoms during the Growth of Ge1-xMnx Nanocolumns on Ge (001)en_US
dc.typeArticleen_US
Appears in Collections:Mathematics and Physics


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  • Full metadata record
    DC FieldValueLanguage
    dc.contributor.authorLe, Thi Giang-
    dc.contributor.authorNguyen, Manh An-
    dc.date.accessioned2017-08-09T07:35:42Z-
    dc.date.available2017-08-09T07:35:42Z-
    dc.date.issued2014-
    dc.identifier.citationLe, T. G. & Nguyen, M. A. (2014). Segregation of Manganese Atoms during the Growth of Ge1-xMnx Nanocolumns on Ge (001). VNU Journal of Science: Mathematics – Physics, 30(2), 10-17.-
    dc.identifier.issn2588-1124-
    dc.identifier.urihttp://repository.vnu.edu.vn/handle/VNU_123/56059-
    dc.description.abstractHigh resolution - transmission electron microscopy (HR-TEM), along with Reflection High-Energy Electron Diffraction (RHEED) and Laser pulse atom probe tomography (LP- APT) were used to investigate the growth kinetics of Ge1-xMnx nanocolumn on Ge(001) and the mechanism of Ge1-xMnx nanocolumn formation. The results evidence that during the deposition of Ge1-xMnx film, Mn atoms diffuse into the Ge matrix to form Mn-rich regions and the upward segregation of Mn atoms along the [001] direction is the origin of the Mn concentration enrichment inside the nanocolumns.en_US
    dc.language.isoenen_US
    dc.publisherH. : ĐHQGHNen_US
    dc.relation.ispartofseriesVNU Journal of Science: Mathematics – Physics-
    dc.subjectDiluted magnetic semiconductorsen_US
    dc.subjectnanocolumnsen_US
    dc.subjectGe3Mn5 clustersen_US
    dc.subjectMn segregationen_US
    dc.titleSegregation of Manganese Atoms during the Growth of Ge1-xMnx Nanocolumns on Ge (001)en_US
    dc.typeArticleen_US
    Appears in Collections:Mathematics and Physics


  • 56.pdf
    • Size : 2,34 MB

    • Format : Adobe PDF

    • View : 
    • Download : 


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